Boffins are using CT scanners to find the formula for the perfect crunchy biscuit.

Researchers at the University of Warwick say that to maximise crunch, biscuit makers must balance cookie thickness with baking time and temperature.

To discover more about the internal structure of biscuits, scientists built an oven inside an X-ray CT scanner – similar to machines used in hospitals.

X-ray equipment was then used to scan biscuits every 20 seconds during the baking process.

The results showed the perfect crunch was dependent on three components of a cookie – thickness, baking time and oven temperature.

The exact formula is a closely guarded industry secret and varies depending on the type of biscuit being made.

Researchers took images of the inside of the biscuit to reveal the porous structure (image via SWNS)

Jay Warnett, associate professor at Warwick Manufacturing Group's (WMG) Centre for Imaging, Metrology and Additive Technologies, said: "We're cracking the code to the perfect biscuit.

"Through our X-rays, we're helping uncover the ideal baking time, thickness, and recipe for the ultimate eating experience."

The experiment was the first step before a larger project later this year.

Researchers took images of the inside of the biscuit to reveal the porous structure, essential for the perfect 'crunch'.

Algorithms were used to speed up the imaging process to cover every stage of the baking process.

The research was led by Dr Warnett and Research Fellow Dr Evelien Zwanenburg.

They now hope to use the process to improve the texture and taste of other baked goods in the future.